Atomic force microscopy: Studying mechanical properties of a cell

Atomic force microscopy (AFM) is a modern imaging technique that generates height representations of a sample surface with subnanometer resolution. Since 1986 it has evolved into a versatile tool which also provides maps of elastic and viscoelastic properties. AFM offers the opportunity to image samples with or without treatment in various environments. Aim of this work is a short description of the relatively new ways of studying mechanical properties of cells – Peak Force Tapping, Stiffness Tomography. Both represent new approaches to obtaining or analysing force-distance curve which are essential for calculating mechanical characteristic of a sample.